|
1.
|
DTA/TGA/DSC system
|
|
2.
|
HPLC system
|
|
3.
|
UV-Visible spectrophotometer
|
|
4.
|
Fluorescence spectrophotometer
|
|
5.
|
Atomic Absorption Spectro-meter
|
|
6.
|
Resistivity measurement system
|
|
7.
|
LC-MS-MS
|
|
8.
|
FTIR
|
|
9.
|
Gas Chromatography
|
|
10.
|
Ellipsometer
|
|
11.
|
Particle Size Analyser
|
|
12.
|
UV-VIS Spectrophotometer
|
|
13.
|
FTIR
|
|
14.
|
FE-SEM
|
|
15.
|
Raman Spectroscope
|
|
16.
|
Confocal Laser Scanning Microscope
|
|
17.
|
Surface Plasmon Resonance Refractometer
|
|
18.
|
Semiconductor Characterization
|
|
19.
|
Cyclic Voltammetry
|
|
20.
|
BET Surface Area Analyser
|
|
21.
|
Optical Tweezer
|
|
22.
|
AFM
|
|
23.
|
NIR Spectrophotometer
|
|
24
|
Electrochemical Analyzer
|
|
25.
|
Rheometer
|
|
26
|
X Ray Imaging Syatem
|
|
27
|
Electrochemical Impedance spectro-meter
|
|
28.
|
Plasma Treatment System
|
|
29.
|
Liquid Nitrogen Facility
|
|
30.
|
Rapid Prototype System
|
|
31.
|
Force Measurement System
|
|
32.
|
Goniometer
|
|
33.
|
Mechanical profilometer
|
|
34.
|
Coherence correlation interferometer(optical profilometer)
|
|
35.
|
Cold Chamber
|
|
36.
|
Spectrophotometer
|
|
37. |
Contact angle measurement
|
]
]
]
]
]
